"Metrology is the science of measurement and it continues to evolve. Today and in the future, government and industry entities will have to address increasingly complex measurement challenges, ranging from the very small (nanoscale devices), to the very large (space station magnitude).
That being said, the 2016 Measurement Science Conference will focus on embracing emerging approaches and technologies to address metrology while still supporting education in current standards, and legacy approaches.
Our goal is to involve the very best speakers and trainers from government and industry to develop and provide NIST seminars and MSC tutorials and technical programs in metrology, calibration, and other quality process approaches."
- Vern Goodwalt
2016 MSC President
Broadening our Horizons in Metrology, Calibration & Quality Processes